Artificial Intelligent Techniques for Electric and Hybrid Electric Vehicles

6Reliability Approach for the Power Semiconductor Devices in EV Applications

Krishnachaitanya, D.¹, Chitra, A.¹* and Biswas, S.S.²

¹ School of Electrical Engineering, Vellore Institute of Technology, Vellore, India

² Engineer and R&D In Charge, BHAVINI, Kalpakkam, India

Abstract

Due to the increasing importance of the power electronic devices in industrial applications, it becomes necessary to consider the reliability and predict the life of the components. This paper initially discusses the general reliability prediction methods for power converters. In a converter, the life of the power electronic devices depends on the failure rate of the individual device. For the evaluation of failure rate of power semiconductor device temperature, current rating, voltage stress, application, quality and environment factors are considered. Life period of the device is decided by the bathtub curve. All the quantitative analysis projected in this work are based on the standard of MIL-217F N2.

Keywords: Reliability, power electronic devices, failure rate, MIL-217F N2, reliability prediction

6.1 Introduction

Nowadays, the usage of power electronic equipment has been widely increasing in industries. The operation time of the electronic equipment is directly proportional to the failure rate of the power electronic component. The failure of the power electronic component affects the overall reliability of the power electronic equipment [1–4]. To assess the reliability of the equipment, failure ...