O'Reilly logo

Characterization of Organic Thin Films by Abraham Ulman

Stay ahead with the world's most comprehensive technology and business learning platform.

With Safari, you learn the way you learn best. Get unlimited access to videos, live online training, learning paths, books, tutorials, and more.

Start Free Trial

No credit card required

10

Secondary Ion Mass Spectrometry As Applied to Thin Organic and Polymeric Films

JIAN-XIN LI, ROBERT W. JOHNSON, JR., and JOSEPH A. GARDELLA, JR.

Contents

10.1   Introduction and Background

10.2   Qualitative Information: Mechanisms of Secondary Molecular Ion Formation

10.3    The Study of Sampling Depth in the SIMS Experiment

10.4   Quantitation in SIMS

10.5   Imaging Applications

10.6   Summary and Prospects

10.1 Introduction and Background

In this chapter, we review and outline the application of secondary ion mass spec-trometry (SIMS) to the study of thin organic and polymeric films. Much of the work that has been accomplished, and is discussed in this chapter, utilizes Langmuir–Blodgett and self-assembly methods to construct model systems ...

With Safari, you learn the way you learn best. Get unlimited access to videos, live online training, learning paths, books, interactive tutorials, and more.

Start Free Trial

No credit card required