Book description
Practicing designers, students, and educators in the semiconductor field face an ever expanding portfolio of MOSFET models. In Compact MOSFET Models for VLSI Design , A.B. Bhattacharyya presents a unified perspective on the topic, allowing the practitioner to view and interpret device phenomena concurrently using different modeling strategies. Readers will learn to link device physics with model parameters, helping to close the gap between device understanding and its use for optimal circuit performance. Bhattacharyya also lays bare the core physical concepts that will drive the future of VLSI development, allowing readers to stay ahead of the curve, despite the relentless evolution of new models.
Adopts a unified approach to guide students through the confusing array of MOSFET models
Links MOS physics to device models to prepare practitioners for real-world design activities
Helps fabless designers bridge the gap with off-site foundries
Features rich coverage of:
quantum mechanical related phenomena
Si-Ge strained-Silicon substrate
non-classical structures such as Double Gate MOSFETs
Presents topics that will prepare readers for long-term developments in the field
Includes solutions in every chapter
Can be tailored for use among students and professionals of many levels
Comes with MATLAB code downloads for independent practice and advanced study
This book is essential for students specializing in VLSI Design and indispensible for design professionals in the microelectronics and VLSI industries. Written to serve a number of experience levels, it can be used either as a course textbook or practitioner's reference.
Access the MATLAB code, solution manual, and lecture materials at the companion website: www.wiley.com/go/bhattacharyya
Table of contents
- Cover Page
- Title Page
- Copyright
- Dedication
- Contents
- Preface
- Acknowledgements
- List of Symbols
-
Chapter 1: Semiconductor Physics Review for MOSFET Modeling
- 1.1 Introduction
- 1.2 Crystal Planes
- 1.3 Band Theory of Semiconductors
- 1.4 Carrier Statistics
- 1.5 Carrier Generation and Recombination
- 1.6 Carrier Scattering
- 1.7 Contacts and Interfaces
- 1.8 Strained Silicon
- 1.9 Basic Semiconductor Equations
- 1.10 Compact MOSFET Models
- 1.11 The p – n Junction Diode
- 1.12 Tunneling Through Potential Barrier
- References
- Problems
- Chapter 2: Ideal Metal Oxide Semiconductor Capacitor
- Chapter 3: Non-ideal and Non-classical MOS Capacitors
-
Chapter 4: Long Channel MOS Transistor
- 4.1 Introduction
- 4.2 Layout and Cross-Section of Physical Structure
- 4.3 Static Drain Current Model
- 4.4 Threshold Voltage (VT) Based Model
- 4.5 Memelink–Wallinga Graphical Model
- 4.6 Channel Length Modulation
- 4.7 Channel Potential and Field Distribution Along Channel
- 4.8 Carrier Transit Time
- 4.9 EKV Drain Current Model
- 4.10 ACM and BSIM5 Models
- 4.11 PSP Model
- 4.12 HiSIM (Hiroshima University STARC IGFET Model) Model
- 4.13 Benchmark Tests for Compact DC Models
- References
- Problems
-
Chapter 5: The Scaled MOS Transistor
- 5.1 Introduction
- 5.2 Classical Scaling Laws
- 5.3 Lateral Field Gradient
- 5.4 Narrow and Inverse Width Effects
- 5.5 Reverse Short Channel Effect
- 5.6 Carrier Mobility Reduction
- 5.7 Velocity Overshoot
- 5.8 Channel Length Modulation: A Pseudo-2-D Analysis
- 5.9 Series Resistance Effect on Drain Current
- 5.10 Polydepletion Effect on Drain Current
- 5.11 Impact Ionization in High Field Region
- 5.12 Channel Punch-Through
- 5.13 Empirical Alpha Power MOSFET Model
- References
- Problems
- Chapter 6: Quasistatic, Non-quasistatic, and Noise Models
-
Chapter 7: Quantum Phenomena in MOS Transistors
- 7.1 Introduction
- 7.2 Carrier Energy Quantization in MOS Capacitor
- 7.3 2-D Density of States
- 7.4 Electron Concentration Distribution
- 7.5 Approximate Methods
- 7.6 Quantization Correction in Compact MOSFET Models
- 7.7 Quantum Tunneling
- 7.8 Gate Current Density
- 7.9 Compact Gate Current Models
- 7.10 Gate Induced Drain Leakage (GIDL)
- References
- Problems
- Chapter 8: Non-classical MOSFET Structures
- Appendix A: Expression for Electric Field and Potential Variation in the Semiconductor Space Charge under the Gate
- Appendix B: Features of Select Compact MOSFET Models
- Appendix C: PSP Two-point Collocation Method
- Index
Product information
- Title: Compact MOSFET Models for VLSI Design
- Author(s):
- Release date: April 2009
- Publisher(s): Wiley-IEEE Press
- ISBN: 9780470823422
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