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CompTIA Data+ DA0-001 Exam Cram
book

CompTIA Data+ DA0-001 Exam Cram

by Akhil Behl, Siva G. Subramanian
January 2023
Beginner to intermediate content levelBeginner to intermediate
528 pages
11h 26m
English
Pearson IT Certification
Content preview from CompTIA Data+ DA0-001 Exam Cram

Chapter 6

Cleansing and Profiling Data

This chapter covers Objective 2.2 (Identify common reasons for cleansing and profiling datasets) of the CompTIA Data+ exam and includes the following topics:

  • Images Duplicate data

  • Images Redundant data

  • Images Missing values

  • Images Invalid data

  • Non-parametric data

  • Data outliers

  • Specification mismatch

  • Data type validation

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Publisher Resources

ISBN: 9780137637362