CompTIA Data+ DA0-001 Exam Cram

Chapter 6

Cleansing and Profiling Data

This chapter covers Objective 2.2 (Identify common reasons for cleansing and profiling datasets) of the CompTIA Data+ exam and includes the following topics:

• Duplicate data

• Redundant data

• Missing values

• Invalid data

• Non-parametric data

• Data outliers

• Specification mismatch

• Data type validation

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