Lattice Defects in Nanocrystalline Films and Multilayers
Abstract
The lattice defects in nanocrystalline thin films and multilayers are overviewed. For electrodeposited Ni the organic additives increase the dislocation density and twin fault probability as well as reduce the grain size. In this sense saccharin is more effective than formic acid. It was found that if a considerable amount of 2-butyne-1,4-diol was added to the bath, the dislocation density and the twin fault probability in electrodeposited nanocrystalline Ni increased with increasing the current density. For magnetron sputtered Cu foil relatively small dislocation density and large twin boundary probability were revealed. Subsequent rolling at room temperature (RT) yielded ...
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