Modeling electromigration using the peridynamics approach
D.T. Read and V.K. Tewary, National Institute of Standards and Technology (NIST) USA
W.H. Gerstle, University of New Mexico USA
Abstract:
This chapter presents a summary of the information and reasoning needed to justify learning about peridynamics for the purpose of analyzing electromigration and provides guidance for the development of a complete peridynamics analysis. The additions needed to convert the original peridynamics model as developed for mechanics problems to a multiphysics model capable of treating electromigration are reviewed. Experimental data on void drift by electromigration are introduced to provide a specific target for a demonstration of the peridynamical ...
Get Electromigration in Thin Films and Electronic Devices now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.
