Electronic Design Automation

3.4.1.2. Pseudo-random testing

One approach, which can reduce test length but sacrifices the circuit's fault coverage, uses a pseudo-random pattern generator (PRPG) for generating a pseudo-random sequence of test patterns [Bardell 1987; Rajski 1998; Bushnell 2000; Jha 2003]. Pseudo-random testing has the advantage of being applicable to both sequential and combinational circuits; however, there are difficulties in determining the required test length and fault coverage.

3.4.1.2.1. Maximum-length LFSR

Maximum-length LFSRs are commonly used for pseudo-random pattern generation. Each LFSR produces a sequence with 0.5 probability of generating 1's (or with probability distribution 0.5) at every output. The LFSR pattern generation technique that ...