3.4.1.3. Pseudo-exhaustive testing
Another approach to reduce the test time to a practical value while retaining many of the advantages of exhaustive testing is the pseudo-exhaustive test technique. It applies fewer than 2n test patterns to an n-input combinational CUT. The technique depends on whether any output is driven by all of its inputs. If none of the outputs depends on all inputs, a verification test approach proposed in [McCluskey 1984] can be used to test these circuits. In circuits in which there is one output that depends on all inputs or the test time that uses verification testing is still too long, a segmentation test approach must be used [McCluskey 1981]. Pseudo-exhaustive testing guarantees single-stuck fault coverage without ...
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