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In situ X-ray scattering of epitaxial oxide thin films

H. Zhou,  and D.D. Fong     Argonne National Laboratory, Argonne, IL, USA

Abstract

In this chapter we review recent work using hard X-ray scattering for the in situ study of oxide heterostructures. The first section provides a survey of different techniques and ongoing developments exploiting the manifold capabilities of third-generation light sources. In later sections we describe studies focused on complex oxide thin-film synthesis, the atomic and electronic structural properties of buried interfaces, and the behavior of catalytically active oxide surfaces in their native environment. We conclude with a brief outlook into the future opportunities made possible by impending synchrotron technologies. ...

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