Scanning probe microscopy (SPM) of epitaxial oxide thin films
Abstract
This chapter reviews the studies of epitaxial oxide films with several scanning probe microscopic techniques, mainly focusing on resolving the local structural, electronic, and magnetic properties of a few subjectively selected oxide systems. Both thin films of “colossal” magnetoresistive manganites and ferroelectric oxide films are the main focus of the reviews. The effects of surface, interface, defects, and off-stoichiometry on film properties are discussed.
Keywords
Ferroelectric critical thickness; Oxide thin films; Phase separation; Scanning probe microscopy11.1. Introduction
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