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Scanning probe microscopy (SPM) of epitaxial oxide thin films

H. Guo,  and J. Zhang     Louisiana State University, Baton Rouge, LA, USA

Abstract

This chapter reviews the studies of epitaxial oxide films with several scanning probe microscopic techniques, mainly focusing on resolving the local structural, electronic, and magnetic properties of a few subjectively selected oxide systems. Both thin films of “colossal” magnetoresistive manganites and ferroelectric oxide films are the main focus of the reviews. The effects of surface, interface, defects, and off-stoichiometry on film properties are discussed.

Keywords

Ferroelectric critical thickness; Oxide thin films; Phase separation; Scanning probe microscopy

11.1. Introduction

Many exotic properties ...

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