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Fit for Developing Software: Framework for Integrated Tests by Ward Cunningham, Rick Mugridge

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Fit for Developing Software

Framework for Integrated Tests

Rick MugridgeWard Cunningham

ImageUpper Saddle River, NJ • Boston • Indianapolis • San FranciscoNew York • Toronto • Montreal • London • Munich • Paris • MadridCapetown • Sydney • Tokyo • Singapore • Mexico City

Many of the designations used by manufacturers and sellers to distinguish their products are claimed as trademarks. Where those designations appear in this book, and the publisher was aware of a trademark claim, the designations have been printed with initial capital letters or in all capitals.

The authors and publisher have taken care in the preparation of this book, but make no ...

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