Test Generation
baaaa
,
baaaaa
,
baaaaaa
,
baaabaaa
baaaba
,
baaabaa
,
baaabaaa
,
baaabbaaa
baaaaa
,
baaaaaa
,
baaaaaaa
,
baaaabaaa
}
If we assume that the IUT has one extra state, that is m = 6, then
we obtain Z and the test set P · Z as follows:
Z
=
X
0
·
W
∪
X
1
·
W
={
a
,
aa
,
aaa
,
baaa
,
aa
,
aaa
,
aaaa
,
abaaa
,
ba
,
baa
,
baaa
,
bbaaa
}
T
=
P
·
Z
={Â,
a
,
b
,
bb
,
ba
,
bab
,
baa
,
baab
,
baaa
,
baaab
,
baaaa
}.
{
a
,
aa
,
aaa
,
baaa
,
aa
,
aaa
,
aaaa
,
abaaa
,
ba
,
baa
,
baaa
,
bbaaa
}
3.6.6 TESTING USING THE W-METHOD
To test the given IUT M
i
against its specification M, we do the following
for each test input:
1. Find the expected response M(t) to a given test input t. This is
done by examining the specification. Alternately, if a tool is avail-
able, and the specification is executable, one could determine the
expected response automatically.
2. Obtain ...