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Hot Embossing by Matthias Worgull

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4.3.1. Tactile Measurement Systems

Tactile measurement systems detect the contour of a molded part along a line. The stylus touches the workpiece at one point with a low touch force. In a second step the stylus moves along the surface. The vertical amplitude of the stylus as a function of the covered distance characterizes the surface profile along a selected line. Systematic measuring of different lines will give a workpiece a surface profile. Typical resolution of tactile measurement systems is in the range of 0.5 μm.

4.3.1.1. Measurement Systems Based on a Probe

Representative for a probe-based measurement system is the atomic force microscope (AFM). The measurement principle is based on an atomic thin pin that is moved along a grid over ...

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