Metrological hyperspectral image analysis through spectral differences
Hilda Deborah1, Noël Richard2, Jon Yngve Hardeberg1 and Jon Atli Benediktsson3, 1Department of Computer Science, Norwegian University of Science and Technology, Gjøvik, Norway, 2Laboratory XLIM, UMR CNRS 7252, University of Poitiers, Poitiers, France, 3Department of Electrical and Computer Engineering, University of Iceland, Reykjavík, Iceland
Abstract
A hyperspectral sensor is able to acquire the physical and optical properties of surfaces. On the other hand, applications in climate research, ecology, cultural heritage, and industry require metrological solutions for diagnosis and control quality. Thus there is a direct relationship between the physical properties ...
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