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Improving Reliability and Quality for Product Success
book

Improving Reliability and Quality for Product Success

by Dongsu Ryu
May 2012
Intermediate to advanced content levelIntermediate to advanced
226 pages
7h 18m
English
CRC Press
Content preview from Improving Reliability and Quality for Product Success
43Chapter three: Novel concepts of reliability technology
the current model. Meanwhile, according to the veried results,
*
Pecht’s
law states that the failure rates of microcircuit devices for digital systems
decrease by about 50% every 15 months. Therefore, the duration of the rel-
evant period in Moore’s law cannot be shorter than that of Pecht’s law.
3.4 The BX life target setting as a durability index
Using the mean time to failure (MTTF) as a lifetime index leads to misun-
derstanding, whereas the index of BX life more properly reects the real
scenario of the life of an assembled product.
The last section explained
that the lifetime target of a unit incorporated into a more complex product
should be equal to or longer than that of
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Publisher Resources

ISBN: 9781466503793