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Improving Reliability and Quality for Product Success
book

Improving Reliability and Quality for Product Success

by Dongsu Ryu
May 2012
Intermediate to advanced content levelIntermediate to advanced
226 pages
7h 18m
English
CRC Press
Content preview from Improving Reliability and Quality for Product Success
48 Improving reliability and quality for product success
In sum, because the lifetime of hardware is dened as the time at
which wear-out failure occurs intensively, it should be estimated only
by considering wear-out failures. Thus, the kinds of failure for a given
item should be analyzed, and random failure should be excluded in cal-
culating the lifetime. Note that wear-out failure mechanisms related
to lifetime are different from random failure mechanisms. Likewise, it
is necessary to distinguish the two kinds of failure mechanisms when
establishing test specications, as well as when analyzing failure data.
Short periods of testing under normal conditions may not precipitate
wear-out failure and t
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Publisher Resources

ISBN: 9781466503793