Inorganic Battery Materials

TEM Studies on Electrode Materials for Secondary Ion Batteries

Sooyeon Hwang and Dong Su

Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY, USA

1. 1 Introduction
2. 2 Cathode Materials
3. 3 Anode Materials
4. 4 In Situ TEM
5. 5 Outlook
6. 6 Related Article
7. 7 Abbreviations and Acronyms
8. 8 References

1 Introduction

Transmission electron microscopy (TEM) is a powerful characterization tool for exploring physical, chemical, and biological sciences.(1–5) It may realize three different functions of imaging, diffraction, and spectroscopy with proper detectors. In operation of a TEM, we normally use two modes: TEM and scanning‐transmission electron microscopy (STEM). At TEM mode, parallel electron beam illuminates the specimen and the interfered image/diffraction patterns are formed at the screen. At STEM mode, the electron beam is focused to a small probe and being scanned while post‐sample detectors collect either transmitted or scattered electrons to form images. If we use a high‐angle annular dark‐field (HAADF) detector to collect the dark‐field signal in STEM mode, the contrast of the image is approximately dependent on the atomic number Z^1.7 (called Z‐contrast imaging). At present, one can achieve sub‐Angstrom resolution in both TEM and STEM modes. While the contrast of HAADF imaging can be directly interpreted from the mass‐thickness, the contrast of a high‐resolution TEM image in TEM mode is mainly related to the interference between the electrons (phase contrast), ...