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Laser-Induced Damage in Optical Materials
ML method, it is a Gaussian. From Equation 7.66, we can derive the distribution of ΔT
M
,
the error in the measurement process. ΔT
M
can be viewed as how well the measurement
process identies the true value of the threshold on the sample. ΔT
M
can be written as
Pr .Δ−
TT h
Monset
=
=
(7.67)
Section 7.3.5.2 showed that the true threshold of a sample can also be a random variable
and depend on defect distribution f and optic area A.
We are now able to address the fundamental question posed at the beginning of this
chapter, “What is the distribution of repeated threshold observations, T
Obs
, on identica