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Low Voltage Electron Microscopy: Principles and Applications by Natasha Erdman, David C. Bell

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Index

Aberrations

Chromatic
Spherical
Diffraction
Correction (SEM)
Correctors
Diffraction limit

Airy disc

Aperture angle control lens (ACL)

 

Beam deceleration

Biological specimen imaging

Brain (thin sections)
Pollen
Bacteriophage

Biological specimen imaging (TEM)

Boersch effect

Boron nitride

Brightness

 

Cameras

CCD
Direct electron detector (DDD or DED)

Cathode Lens

Cathodoluminescence

Charge balance (specimen charging)

Convergence angle

 

Delocalization

Detectors (SEM)

Secondary
Backscatter
LABesub
EsBsub
DBSsub
STEM-in-SEMsub

Detectors (STEM)

High angle annular dark field detector (HAADF),
Annular bright field detector (ABF)

Diffraction pattern

Dual Beam (FIB)

 

Elastic scattering

EDS

EELS (electron energy loss spectroscopy)

Electron detectors (STEM)

Annular bright field
High annular dark field (HAADF)
Medium angle annular dark field (MAADF)
Secondary

Electron dose

Electron source

Brightness
Thermionic
LaB6
Schottky (thermal) FE
Cold cathode FE
In-lens FE-SEM gun
Energy spread

Energy filtering (SEM)

EsB
ExB
r-filter

Envelope function

Energy spread

Environmental stability

 

Graphene

 

Helium ion microscope

 

Image filtering

Immuno-labeling

Ionization (inner shell)

 

LEEM (LEED)

Lenses (SEM)

Electromagnetic
Hybrid or compound
Immersion
In-lens SEM

Low-dose imaging

 

Monochromator

Monte-Carlo simulation

Multislice simulation

 

Nanoparticles

Nanoporous materials

Nanorods

Nanotechnology

Nanowires

 

Partial coherence

Plasma cleaner

Plasmon

Probe current

Probe size

 

Resolution

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