December 2017
Intermediate to advanced
274 pages
8h 6m
English
Yaojun Zhang, Wujie Wen, Hai Li and Yiran Chen
Department of Electric and Computer Engineering, Swanson School of Engineering, University of Pittsburgh, Pittsburgh, Pennsylvania
CONTENTS
3.2.3 Variability Sources in STT-RAM Designs
3.3 SLC STT-RAM Reading Performance with Technology Scaling
3.3.1 Switching Performance and Reading Disturbance
3.4 Simulation and Discussion of SLC STT-RAM