References

[Abr90] Miron Abramovici, Melvin A. Breuer, and Arthur D. Friedman, Digital System Testing and Testable Design, Computer Science Press, Rockville, MD, 1990.

[Aga07] Kanak Agarwal and Sani Nassif, “Characterizing process variation in nanometer CMOS,” in Proceedings, DAC 2007, ACM Press, 2007, pp. 396–399.

[Ake67] S. B. Akers, “A modification of Lee’s path connection algorithm,” IEEE Transactions on Electronic Computers, February, 1967, pp. 97–98.

[ARM08] ARM, “Standard cell libraries overview,” http://www.arm.com/products/physicalip/stan-dardcell.html, accessed May 26, 2008.

[Alt06] Josep Altet, Wilfrid Clayes, Stefan Dilhaire, and Antonio Rubio, “Dynamic surface temperature measurements in ICs,” Proceedings of the ...

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