Nanoscale Semiconductor Memories

11	Phase-Change Memory Devices and Electrothermal Modeling Helena Silva, Azer Faraclas, and Ali Gokirmak

CONTENTS

11.1  Current Status of Data Storage

11.2  Phase-Change Memory

11.3  Electrothermal Models for PCM Devices

11.3.1  Material Parameters

11.3.1.1  Electrical Conductivity

11.3.1.2  Thermal Conductivity

11.3.1.3  Thermal Boundary Resistance

11.3.1.4  Heat Capacity and Latent Heat of Fusion

11.3.1.5  Seebeck Coefficient

11.3.2  Amorphization Model

11.3.3  Access Transistor

11.4  Modeling Results

11.4.1  Effect of Electrical Resistivity

11.4.2  Thermoelectric Effects

11.4.2.1  Thomson Heat

11.4.2.2  Peltier Heat

11.5  PCM Design and High-Temperature Nanoelectronics

Acknowledgment

References

11.1  CURRENT STATUS OF DATA STORAGE

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