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Nanotechnology and Functional Materials for Engineers
book

Nanotechnology and Functional Materials for Engineers

by Yaser Dahman
January 2017
Intermediate to advanced content levelIntermediate to advanced
282 pages
9h 48m
English
Elsevier
Content preview from Nanotechnology and Functional Materials for Engineers
Chapter 2

Generic Methodologies for Characterization*

Abstract

One of the major aspects in nanoparticle science is studying its characteristics as it will teach us how these nanoparticles behave. However, since there are several types of nanoparticles, each nanoparticle class has different methodologies that are followed (e.g., scanning probe techniques and spectroscopy techniques). Scanning probe techniques are those that measure the surface morphology in real space with a resolution at the atomic level (e.g., AFM and MFM). Scanning probe microscopy originated from scanning tunneling microscopy. Electron microscopy that examines nanostructure characterization includes transmission electron microscopy and scanning electron microscopy. Fourier transform ...

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Publisher Resources

ISBN: 9780323524667