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Optical Fiber Telecommunications VA, 5th Edition
book

Optical Fiber Telecommunications VA, 5th Edition

by Ivan Kaminow, Alan E. Willner, Tingye Li
July 2010
Intermediate to advanced content levelIntermediate to advanced
944 pages
34h 12m
English
Academic Press
Content preview from Optical Fiber Telecommunications VA, 5th Edition
Cluster Analysis Using the Negative Binomial Model
For a given product line, both random defect yield limits and systematic yield
limits can be extracted using cluster analysis [44]. Reorganization of wafer probe
maps grouping adjacent devices into cells containing 1, 2, 3, 4 (2 2), 6 (2 3),
and 9 (3 3) chips enables an analyst to emulate and calculate the percent yield for
dice with various area sizes. All chips of a given cell must pass all tests for a
grouped cell to pass and qualify for production. Using a least square method, the
six yield points obtained for the various areas are fitted to an equation representing
the defect distribution.
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Publisher Resources

ISBN: 9780123741714