the L–I curve, also shown in Figure 20.23, and can actually cause the device to turn
off at higher bias currents.
A caveat with active device simulation on a spatial mesh is that it requires
accurate knowledge of many material para meters, and in the end, may still deviate
from experimental results due to the un-simulated portions of the problem (i.e.,
those not within the simulation domain). For example, para sitic effects due to the
laser die or package, or even due to the measurement apparatus itself, may cause
discrepancies between simulation and experiment . The power of these simulations
comes from their ability to show the performance trends of the device, as its
material or geometric parameters are varied.
20.3 OPTICAL COMMUNICATION SYSTEM