
16 ◾ Mitsuo Takeda
Fourier Transform Method of Fringe Analysis
Sub-Angstrom Atom
Displacement Measurement
Femto/Attosecond Pulse
Analysis SPIDER)
Sub-fluxoidMagnetic Flux
Measurement (Electron Holography)
Sub-nanometer Wavefront
Aberration Measurement (EUV)
Cell Deformation
Measurement
Spectrum Fringe
Analysis for OCT
Tear Topography
Dynamics
Measurement
X-ray Coherence
Measurement
Refractive Index
Analysis in EUV
Laser Plasma
Diagnostics
Near Field
Interferometry
X-ray Phase Imaging
Combustion Analysis
Aspheric
Surface
Measurement
Flow Analysis
Nondestructive
Testing
Photoelastic Analysis
3-D Object Recognition
High Speed
Profilometry
Dynamic Polarimetry
in Film Analysis