CONTENTS
6.2 TSV Technologies and Implications to Power/Signal Integrity
6.2.1 Via-First TSV Technology
6.2.2 Via-Middle TSV Technology
6.3 System-Wide 3D Power Integrity
6.3.1 Case Study: Power Distribution in a Nine-Plane 3D Processor-DRAM Stack
6.3.1.2 Power Distribution Network Model
6.3.2 Decoupling Capacitors for Power-Gated 3D-ICs
6.3.2.1 Reconfigurable Topology
6.4 System-Wide 3D Signal Integrity
6.4.1 Efficient Analysis of TSV-to-Transistor Noise Coupling
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