Book description
A Complete Guide to Transmitting Electrical Power and Data over Ethernet Cables
Power over Ethernet Interoperability explains how to safely transmit DC power over an existing data network cabling structure so that separate AC electrical wiring is not needed to power up devices connected to the network. With a focus on cost-effective unshielded twisted pair (UTP) cables, this book provides proven methods for designing reliable Power over Ethernet (PoE) equipment and ensuring that it functions effectively. Details on the IEEE 802.3af/at standards and how various devices can operate from PoE are also contained in this practical resource.
Coverage includes:
- The evolution of PoE
- Overview of PoE implementations
- Detection
- Classification
- Inrush and power-up
- Operation
- Maintain power and disconnect
- PoE state-machine diagrams
- Magnetics
- Isolation, PCB design, and safety
- Surge testing and protection
- Lab skills, thermal management, and decoupling
- N-pair power delivery systems
- Auxiliary power and flyback design
Table of contents
- Cover
- About the Author
- Title Page
- Copyright Page
- Contents
- Preface
- Acknowledgments
-
Chapter 1: The Evolution of Power over Ethernet
- Part 1: An Overview of Ethernet
-
Part 2: The Historical Evolution of PoE
- Introduction
- Blasts from the Past
- Don’t SWER No More
- The Twisted Pair and the Principle of Immunity
- Common-Mode Rejection by Coils/Transformers and Other Techniques
- Immunity and Emissions
- Twist Rate and Wire Diameter
- Categories of Ethernet Cable
- PoE Cable Categories
- Bandwidth and Information Capacity of Cables
- Effect of Temperature on Cable Performance
- Cable Temperature Rise Caused by PoE
- The Center-Tapped (Hybrid) Transformer and the Phantom Circuit
- Methods of Injecting PoE via Phantom Power
- PoE Chip Vendors: The Emerging Landscape of PoE
- Chapter 2: Overview of PoE Implementations
-
Chapter 3: Detection
- Overview
- Pre-Standard/Legacy Detection Schemes
- IEEE Detection
- Practical Voltage and Current Limits during Detection
- Some Practical Detection Techniques
- Predetection/Open-Circuit Detection/Initialization
- Detection Back Off
- Detection Signature Resistor Disengagement
- Lower Detection Threshold: Practical Concerns in PSEs and PDs
-
Chapter 4: Classification
- What Is Classification?
- Types of Classification Methods and Backward Compatibility
- Practical Limits of AC-DC Power Supplies
- Classification Is Optional for Type 1 Application But Recommended
- Default Class (Class 0)
- LLDP or Physical-Layer Classification for Type 2 PSEs?
- Class Levels in Layer-1 Classification
- 1-Event Classification
- Classification “Gray Areas”
- Reported “Interoperability” Issues
- Timings during 1-Event Classification
- Dissipation during Classification
- 2-Event Classification
- Timings during 2-Event Classification
- Overall Timing Constraints
- Multiple-Port Compliance and Systems Issues
- Discharging Port Capacitances and Actual Voltage “Seen” by the PD
- Detection Signature Resistor Disengagement Concerns
- Detection Signature Resistor beyond Detection
- IEEE 802.3at Classification Details Summary
- IEEE 802.3at Table 33-8 Explained Further
- 1-Finger or 2-Finger Classification for Type 2 PSEs?
-
Chapter 5: Inrush and Power-Up
- Overview
- Inrush Behavior
- Purpose of Inrush Limiting and the PD Bulk Capacitance
- Practical PSE Design for Inrush Currents
- Undervoltage Lockout Thresholds
- Analyzing the Inrush Phase
- Ensuring Proper Power-Up Behavior
- Testing the Inrush Performance of PSEs
- A Discrete PD Front-End for Testing PSEs
- The Inrush Timer and the Real End of Inrush
- Types of Power-Up Behavior and Power-On
- Minimum Inrush Below 30 V
- Type 2 PD Delay Timer
- Rise-Time Limits
- Some Practical PD Design Issues
-
Chapter 6: Operation
- Background
- Relevant Sections to Refer To in the AF Standard
- Reasons for Protection
- Brief Overview of Overloads and Shorts as Per AF Standard
- Testing PSE’s Overload and Short-Circuit Protection as Per AF Standard
- The Short-Circuit Enigma of the AF (and AT) Standard
- Device Dependency in the AF Standard
- Evolution of Overload/Short-Circuit Perspective
- Short-Circuit Range Comparison (AF and AT)
- General Philosophy in Interpreting the AT Standard
- Overload and Short-Circuit Requirements as Per AT Standard
- Peak Power Calculations
- The Recommended Operating Templates Collected and Explained
- Some PSE-Controller Design Suggestions for AT Compliance
- ICUT Monitoring as Per AT Standard
- Current Monitoring and Current Limiting Accuracy
- Allowed Port Voltage Sag under Current Limiting
- Resumption after “Error” and Timings
- Summary of Peak and Operating Values
- Chapter 7: Maintain Power and Disconnect
- Chapter 8: PoE State-Machine Diagrams
-
Chapter 9: Magnetics
- Overview
- Open-Circuit Inductance (OCL)
- DC-Bias Current Caused by Baseline Wander
- Stored Energy and Core Saturation
- Resistance Imbalance
- “Imbalance” as Per PoE Standards
- Current-Imbalance IUNB: What Is It Really?
- Worst-Case Imbalances and DC Bias
- Derating Power Based on DC-Bias Capability
- Ballasting Resistors
- EMI Filtering and Common-Mode Filters with PoE
- Isolation Requirements in Magnetic Components
- Hi-Pot Testing for PoE
- Limits on the Y-Capacitance in Magjacks
- Vendors Cheating on Y-caps—to Our Advantage
-
Chapter 10: Isolation, PCB Design, and Safety
- Safety Standards Overview
- PoE and Safety
- Steady and Transient Voltages
- Fault Conditions
- PoE Rails, Ethernet/Telecom Systems
- Isolation Requirements
- The PoE Hi-Pot Test
- Failing the Hi-Pot Test
- Separation Anxiety
- Causes of Isolation Breakdown and Recommended Minimum Clearance
- Summarizing Recommendations for Minimum Clearance
- The Concept of Creepage
- Coating versus Noncoating
- Separations in Inner Layers
- Minimum Vertical Separation in PCB
- Secondary Discharge
- PD Isolation Requirements
- Higher Surge, Cable ESD, and Reliability
- Limited Power Source
-
Chapter 11: Surge Testing and Protection
- Overview
- Mandatory versus Custom-Driven Requirements
- Template for Testing during PoE Design Qualification Phase
- Recommended Surge Test Setup
- What Happens during the Surge Test
- Other Setups for Surge Testing
- Modeling the Combination Wave Generator (CWG)
- Recommendations for AC Disconnect
- Recommendations for Common-Mode Filter Position
- Recommendations for DC Disconnect
- Surviving the 10/700-μs Surge Test
- Protecting the PD from Surges
- Semiconductors for Protection and Some PCB Recommendations
- PoE Is an Intrabuilding Standard
- GR-1089 (Telcordia) Requirements
- ESD Protection of ICs
- Cable ESD (CDE)
- Port Protection Diode in PoE: Any TVS Required?
- Should D1 Be a TVS?
- Appendix: Modeling and Analysis of the Combination-Wave Generator Used for Surge Testing (EN 61000-4-5)
-
Chapter 12: Lab Skills, Thermal Management, and Decoupling
- Using Oscilloscopes Wisely (in PoE)
- Measuring PSE Port Voltage
- Earth Ground Loop Issue and Isolating the Oscilloscope
- Thermal Management
- The JEDEC Standards (JESD)
- Types of Test Boards
- Improving PCB Thermal Resistance for Exposed Pad Packages
- Practical Thermal Resistances
- Sizing Copper Traces
- Calculating Junction Temperature
- Different Ways of Specifying Maximum Operating Temperature
- Fan Speed
- Proper Chip Decoupling
-
Chapter 13: N-Pair Power Delivery Systems
- Overview
- Starting with Resistance
- Loop Resistances for N-Pair Power Delivery
- Power Estimates for N-Pair Power Delivery
- Maximum Power Delivery over Long Distances Using Available PSEs
- Impedance Matching for Maximum Power Delivery
- The Power Delivery Problem
- Mathematical Solution
- Lowering the PD Undervoltage Lockout
- Plotting Power Delivery Curves over Long Distances
- Sample Numerical Calculations for N-Power Delivery
- How Far Will a Given PD Operate?
- Learning from Telephony
- Four-Pair Implementations
- Future Innovation
- Chapter 14: Auxiliary Power and Flyback Design
- Index
Product information
- Title: Power Over Ethernet Interoperability Guide
- Author(s):
- Release date: February 2013
- Publisher(s): McGraw-Hill
- ISBN: 9780071798266
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