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Professional Windows® Embedded Compact 7 by Thierry Joubert, David Jones, Samuel Phung

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Chapter 13

Testing with Compact Test Kit

WHAT’S IN THIS CHAPTER?

  • Establishing connectivity for the Compact Test Kit
  • Testing with the Compact Test Kit

The Compact Test Kit is part of the Windows Embedded Compact 7 software suite. This test kit is a complete makeover from the CE Test Kit (CETK) for the previous versions, with a new graphical user interface and added features.

The Compact Test Kit provides the facilities to test and validate whether a Compact 7 device driver, BSP, and OEM hardware adaptation code meet the design specification needed to support the Compact 7 OS kernel, and Microsoft’s quality control guidelines.

The CTK is intended to help minimize the time and resources needed to perform testing to ensure the design meets a certain level of performance and quality.

The CTK’s ease of use and setup does not mean that it’s a lightweight testing environment. CTK tests are thorough and provide credible test data in a standardized report format that can meet rigid testing requirements and provide useful test data and documentation for the project. Microsoft’s Windows Embedded Compact team uses the same CTK test to perform BSP and device driver testing for its BSP and device driver certification program.

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