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Professional Windows® Embedded Compact 7 by Thierry Joubert, David Jones, Samuel Phung

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WINDOWS EMBEDDED COMPACT TEST KIT

Windows Embedded Compact Test Kit, also referred to as Compact Test Kit (CTK), is a test suite provided as part of the Compact 7 software suite. The CTK’s user interface is a completely new design from the previous version, CE Test Kit (CETK).

CTK is designed to test BSP, OAL, and device driver functionality to ensure these components include the required function to support Compact 7 and meet the performance requirements. The Compact Test Kit also provides the facility to develop custom tests by the OEM to test hardware.

The previous version, CE Test Kit (CETK), has been around for quite some time. As a result, when searching for information resources related to CTK, whether on MSDN or via the Web, you can run across quite a few articles referring to CETK.

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