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Reference Data for Engineers, 9th Edition by Wendy M. Middleton, Mac E. Van Valkenburg

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F

F1 layer, wave propagation in, 33-7
F2 layer, wave propagation in, 33-7
Fabrication
IC, 20-11
process, 20-22–26
Fabry-Perot cavity, 41-6–8
Factors, conversion, 3-13–17
Factory-programmed ROM, definition of, 20-5
Fades
average duration of, mobile signal, 46-12
distribution of durations, 46-12
Fading, 33-19–20
atmospheric multipath, 33-19
multipath, 46-14
reflection multipath, 33-19
Rican, slow nonselective, 24-22
selective, mobile signal, 46-12, 46-17
Failure data collection and assessment, 45-9
Failure mode analysis, 45-6–8
Failure modes and effects analysis (FMEA), 45-6
Failure rate, definition of, 20-5
Fall time, definition of, 20-5
False-pulse noise, in pulse-code modulation, 23-17–18
Fan-out, definition of, 20-5

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