Introduction to Part 1
Electronic components and devices, including equipment for systems, are fabricated from materials and structures that degrade over time under normal operational conditions. It is therefore necessary to anticipate and quantify the occurrence of system failures, but the goal of “reliability engineering” is to first clarify the failure paradigm in terms of statistics and physics of failure (PoF) or simply the parts count approach. Statistical approaches and underlying mathematics have been developed over the last century to describe failure rates, including the well-known bathtub curve showing a schematic of failure rate behavior with time.
According to Wikipedia, predictive (or logical) analysis encompasses a variety of techniques derived from statistics, data extraction and game theory that analyze past and present facts to make predictive assumptions about future events.
In the first part of this book, we share our perception of the experimental development applied to existing reliability and maintenance paradigms that has taken place over several decades, been presented by many authors and appeared in numerous papers.
Chapter 1 aims to i) establish how applied engineering for failure prediction and SHM (structural health monitoring) of electronic equipment and systems is implemented, and ii) present basic statistical tools defined for reliability modeling implementation as well as studies related to active microelectronic parts. Chapter 2 focuses on experimental ...
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