Index
Note: Page numbers followed by f indicate figures and t indicate tables.
A
Accelerated life testing (ALT)
block modeling 9
expected failure mechanisms 229
extrapolation 85
HALT 19
lifetime data 229
optoelectronic devices 84–85
reliability calculations 229–234
stress and expected life 227–228
thermal cycling 238–242
time compression 227
vendor data reliability calculation 235–236
Acceleration factor determination
CMOS metallization corrosion 245–246
SAC solder failure mechanism 240–241
AFM See Atomic force microscopy (AFM)
ALT See Accelerated life testing (ALT)
Atomic force microscopy (AFM) 60–61
Automotive electronics industry 8
Automotive integrated circuits (ICs) ...
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