Chapter 12: Verification of residual current devices

Abstract

Residual current devices are relatively often damaged due to dusty or wet atmosphere, low temperature, as well as vibrations. They may significantly change the tripping threshold after being closed for a very long time. Therefore international standards require that residual current devices are periodically tested in more detail than overcurrent protection devices. This chapter discusses the normative verification of residual current devices referring to the real tripping current and the break time. Technical traps leading to incorrect results of the aforementioned tests are indicated. Principles of fault diagnosis in a circuit with residual current devices, referring to the ...

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