Reliable and power-aware architectures
Fundamentals and modeling
A. Vega*; P. Bose*; A. Buyuktosunoglu*; R.F. DeMara† * IBM T. J. Watson Research Center, Yorktown Heights, NY, United States† University of Central Florida, Orlando, FL, United States
Abstract
Chip power consumption is one of the most challenging and transforming issues that the semiconductor industry has encountered in the past decade, and its sustained growth has resulted in various concerns, especially when it comes to chip reliability. It translates into thermal issues that could harm the chip. It can also determine battery life in the mobile arena. Furthermore, attempts to circumvent the power wall through techniques like near-threshold voltage computing lead ...
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