Soft Errors

Soft Errors

by Jean-Luc Autran, Daniela Munteanu
Released February 2015
Publisher(s): CRC Press
ISBN: 9781466590847

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Book description

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.

Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:

  • Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms
  • Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests
  • Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits
  • Explores trends for future technological nodes and emerging devices

Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.

Table of contents

  1. Front Cover (1/3)
  2. Front Cover (2/3)
  3. Front Cover (3/3)
  4. Contents (1/2)
  5. Contents (2/2)
  6. Foreword
  7. Preface (1/2)
  8. Preface (2/2)
  9. Acknowledgments
  10. Authors
  11. Introduction (1/2)
  12. Introduction (2/2)
  13. Glossary (1/2)
  14. Glossary (2/2)
  15. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (1/7)
  16. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (2/7)
  17. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (3/7)
  18. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (4/7)
  19. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (5/7)
  20. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (6/7)
  21. Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background (7/7)
  22. Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors (1/5)
  23. Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors (2/5)
  24. Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors (3/5)
  25. Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors (4/5)
  26. Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors (5/5)
  27. Chapter 3: Natural Radioactivity of Electronic Materials (1/6)
  28. Chapter 3: Natural Radioactivity of Electronic Materials (2/6)
  29. Chapter 3: Natural Radioactivity of Electronic Materials (3/6)
  30. Chapter 3: Natural Radioactivity of Electronic Materials (4/6)
  31. Chapter 3: Natural Radioactivity of Electronic Materials (5/6)
  32. Chapter 3: Natural Radioactivity of Electronic Materials (6/6)
  33. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (1/6)
  34. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (2/6)
  35. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (3/6)
  36. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (4/6)
  37. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (5/6)
  38. Chapter 4: Alpha-Radiation Metrology in Electronic Materials (6/6)
  39. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (1/8)
  40. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (2/8)
  41. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (3/8)
  42. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (4/8)
  43. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (5/8)
  44. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (6/8)
  45. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (7/8)
  46. Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits (8/8)
  47. Chapter 6: Accelerated Tests (1/6)
  48. Chapter 6: Accelerated Tests (2/6)
  49. Chapter 6: Accelerated Tests (3/6)
  50. Chapter 6: Accelerated Tests (4/6)
  51. Chapter 6: Accelerated Tests (5/6)
  52. Chapter 6: Accelerated Tests (6/6)
  53. Chapter 7: Real-Time (Life) Testing (1/8)
  54. Chapter 7: Real-Time (Life) Testing (2/8)
  55. Chapter 7: Real-Time (Life) Testing (3/8)
  56. Chapter 7: Real-Time (Life) Testing (4/8)
  57. Chapter 7: Real-Time (Life) Testing (5/8)
  58. Chapter 7: Real-Time (Life) Testing (6/8)
  59. Chapter 7: Real-Time (Life) Testing (7/8)
  60. Chapter 7: Real-Time (Life) Testing (8/8)
  61. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (1/6)
  62. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (2/6)
  63. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (3/6)
  64. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (4/6)
  65. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (5/6)
  66. Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and Circuits (6/6)
  67. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (1/6)
  68. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (2/6)
  69. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (3/6)
  70. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (4/6)
  71. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (5/6)
  72. Chapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes (6/6)
  73. Chapter 10: Scaling Effects and Their Implications for Soft Errors (1/5)
  74. Chapter 10: Scaling Effects and Their Implications for Soft Errors (2/5)
  75. Chapter 10: Scaling Effects and Their Implications for Soft Errors (3/5)
  76. Chapter 10: Scaling Effects and Their Implications for Soft Errors (4/5)
  77. Chapter 10: Scaling Effects and Their Implications for Soft Errors (5/5)
  78. Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study (1/5)
  79. Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study (2/5)
  80. Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study (3/5)
  81. Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study (4/5)
  82. Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study (5/5)
  83. Chapter 12: SOI, FinFET, and Emerging Devices (1/13)
  84. Chapter 12: SOI, FinFET, and Emerging Devices (2/13)
  85. Chapter 12: SOI, FinFET, and Emerging Devices (3/13)
  86. Chapter 12: SOI, FinFET, and Emerging Devices (4/13)
  87. Chapter 12: SOI, FinFET, and Emerging Devices (5/13)
  88. Chapter 12: SOI, FinFET, and Emerging Devices (6/13)
  89. Chapter 12: SOI, FinFET, and Emerging Devices (7/13)
  90. Chapter 12: SOI, FinFET, and Emerging Devices (8/13)
  91. Chapter 12: SOI, FinFET, and Emerging Devices (9/13)
  92. Chapter 12: SOI, FinFET, and Emerging Devices (10/13)
  93. Chapter 12: SOI, FinFET, and Emerging Devices (11/13)
  94. Chapter 12: SOI, FinFET, and Emerging Devices (12/13)
  95. Chapter 12: SOI, FinFET, and Emerging Devices (13/13)
  96. Back Cover

Product information

  • Title: Soft Errors
  • Author(s): Jean-Luc Autran, Daniela Munteanu
  • Release date: February 2015
  • Publisher(s): CRC Press
  • ISBN: 9781466590847