Chapter 15. Analog and Mixed-Signal Test Architectures

F. Foster DaiAuburn University, Auburn, Alabama

Charles E. StroudAuburn University, Auburn, Alabama

About This Chapter

The scale of analog integrated circuits (ICs) and the analog portion of mixed-signal ICs is usually relatively small compared to digital IC counterparts—hundreds of devices in an analog circuit compared to millions to hundreds of millions of devices in a digital circuit. However, testing analog circuits poses a number of unique testing problems when compared to digital circuits and, as a result, requires a variety of different and unique test architectures and approaches. For example, there are no analog fault models that have been widely accepted, as is the case in digital testing. ...

Get System-on-Chip Test Architectures: Nanometer Design for Testability now with O’Reilly online learning.

O’Reilly members experience live online training, plus books, videos, and digital content from 200+ publishers.