Standard Error of Measurement (SEM)
The standard error of measurement (SEM) is used to create a score band around an individual’s score. This score band takes into account that one exam score is just one estimate that is subject to error, and that the examinee’s true score is better captured by a range of values expressed within a probability statement. This section of the technical appendix provides instructions for computing the SEM, includes directions for construction of an error band, and discusses the implications of the SEM for CRT development.
To compute the standard error of measurement the following steps need ...
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