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Test Driven Development for Embedded C
book

Test Driven Development for Embedded C

by James W. Grenning
April 2011
Intermediate to advanced content levelIntermediate to advanced
356 pages
8h 55m
English
Pragmatic Bookshelf
Content preview from Test Driven Development for Embedded C

Dual-Target Incompatibilities

The world is real, not ideal. Consequently, there will be differences in and out of the target. To test production code in both environments, you need code that works the same in both environments. Let’s look at some of the portability problems you might encounter.

Runtime Libraries Have Bugs

Shocking but true, runtime libraries have bugs. A few years back, I was working with a client adopting TDD. We were porting the test harness to a new target processor. We ran into a little snag. The target version of strstr did not behave like all other versions of strstr before it.

CppUTest compiled with no problem. The unit test harness had its own suite of unit tests, so the first order of business was to run those ...

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Publisher Resources

ISBN: 9781941222997Errata Page