4
Faster-than-at-Speed Test for Screening Small-Delay Defects
Ahmed Nisar and Tehranipoor Mohammad
4.3 Test Pattern Delay Analysis
4.3.1 Dynamic IR Drop Analysis at Functional Speed
4.3.2 Dynamic IR Drop Analysis for the Faster-than-at-Speed Test
4.4 IR Drop Aware Faster-than-at-Speed Test Technique
4.4.2 Estimation of Performance Degradation ΔT′Gi
4.1 Introduction
Technology scaling is introducing a larger population of timing-related defects in integrated circuits (ICs), and postsilicon performance verification is becoming an ever more challenging problem. The transition delay fault (TDF) model is widely ...
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