VLSI Design Methodology Development, First Edition

Chapter 15. Electromigration (EM) Reliability Analysis

15.1 Introduction to EM Reliability Analysis

The electrical analysis flows described in previous chapters pertain to the correct functionality of the (tapeout) design database. An additional analysis requirement is to ensure that the design will satisfy product lifetime reliability requirements. The product lifetime is typically denoted as “N power-on hours per year for Y years.” Often, the package engineering team adds the consideration “M power cycles per year” for its analysis of the mechanical stress on the die/package attach technology due to thermal cycling.

15.1.1 Design Robustness and Reliability

There are two classes of SoC design specifications to address for product lifetime ...