R4.1—Introduction
[bib04_001] [Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, Piscataway, NJ, 1994.
[bib04_002] [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, New York, 2000.
[bib04_003] [Holland 1975] J. H. Holland, Adaptation in Natural and Artificial Systems, University of Michigan Press, Ann Arbor, MI, 1975.
[bib04_004] [Jha 2003] N. Jha and S. Gupta, Testing of Digital Systems, Cambridge University Press, Cambridge, U.K., 2003.
R4.2—Random Test Generation
[bib04_005] [David 1976] R. David and G. Blanchet, About random fault detection of combinational networks, IEEE Trans. ...
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