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X-Ray Fluorescence Spectrometry and Related Techniques by Rene Van Grieken Grieken, Eva Margui

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Chapter 6

Total Reflection X-Ray Spectrometry (Txrf)

6.1 INTRODUCTION AND BASIC PRINCIPLES

Since its development, one of the drawbacks of conventional EDXRF that has hampered the determination of ultratrace element levels in small samples has been the high background due to scatter from a sample. In 1971, an analytical note published in Review of Scientific Instruments by Yoneda and Horiuchi (Yoneda and Horiuchi, 1971) reported the benefits of the total reflection of X-rays at an optically flat surface for spectrochemical analysis. The basic principle was that if a low, divergent, almost parallel X-ray beam impinges on the flat, smooth surface of a reflector at an angle smaller than the critical angle (φcrit ~ 0.1°), total reflection occurs. ...

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