Combined Structure-Texture-Microstructure-Stress-Phase Reflectivity Analysis
9.1. Initial queries
Nowadays, the major problem for analysis by diffraction/scattering of rays is that physical chemists are creating samples of increasing complexity (thin or massive heterostructures, polyphased materials, etc.) and require that the sample’s characteristics are fully determined without the analysis being destructive.
Here is a typical actual problem that regroups actual engrossment concerning diffraction analysis:
A thin perovskite-like ferroelectric film is crystallized in a pseudo-cubic phase (i.e. with a lot of peaks overlaps) in order to endow it with optimized properties. The direct consequence is that the desired property is indeed increased, but only along specific crystalline directions, and thus, the sample has to be given enough anisotropy.
Dilemma 1: Quantitative texture analysis has to be undertaken in order to correctly interpret the diffraction diagrams regarding structure analysis (and this can deviate considerably from the bulk material). In turn, without an exact knowledge of the structure, determination of the quantitative texture is for those less delicate to operate!
For such a case, the elaboration of a powder of exactly the same material structure is not possible. It is generally common sense that texture introduces a bias to structure determination as both parameters have an influence on peak intensities. However, structure influences Fh, while texture ...