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Compact Models for Integrated Circuit Design
book

Compact Models for Integrated Circuit Design

by Samar K. Saha
September 2018
Intermediate to advanced content levelIntermediate to advanced
545 pages
14h 16m
English
CRC Press
Content preview from Compact Models for Integrated Circuit Design

8

Modeling Process Variability in Scaled MOSFETs

8.1    Introduction

This chapter presents compact MOSFET (metal-oxide-semiconductor field-effect transistor) modeling approaches for process variability-aware VLSI (very-large-scale-integrated) circuit CAD. The circuit design for advanced VLSI technology is severely constrained by random and systematic process variability [1]. With continued miniaturization of MOSFET devices [2, 3, 4, 5, 6, 7, 8], performance variability induced by process variability has become a critical issue in the design of VLSI circuits using advanced CMOS (complementary metal-oxide-semiconductor) technologies. Process variability in scaled CMOS technologies severely impacts the delay and power variability in VLSI devices, ...

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Publisher Resources

ISBN: 9781482240672