September 2010
Intermediate to advanced
226 pages
6h 21m
English
Acronyms
| ACAA | Average Coherence Approximation Algorithm |
| BL | Boundary Layer |
| CD | Critical Dimension |
| CMTF | Critical Modulation Transfer Function |
| DCT | Discrete Cosine Transform |
| DEL | Double Exposure Lithography |
| DPL | Double Patterning Lithography |
| DUVL | Deep Ultraviolet Lithography |
| EBL | E-Beam Lithography |
| EUVL | Extreme Ultraviolet Lithography |
| FDTD | Finite-Difference Time-Domain Method |
| FFT | Fast Fourier Transform |
| IC | Integrated Circuit |
| ILT | Inverse Lithography Technique |
| ITRS | International Technology Roadmap for Semiconductors |
| MOS | Metal Oxide Silicon |
| MoSi | Molybdenum Silicide |
| MTF | Modulation Transfer Function |
| NA | Numerical Aperture |
| OAI | Off-Axis Illumination |
| OPC | Optical Proximity Correction |
| PAC | Photoactive Compound |
| PCI | Partially Coherent Illumination |
| PSF | Point Spread Function |
| PSM | Phase-Shifting Mask |
| RET | Resolution Enhancement Technique |
| SMO | Simultaneous Source and Mask Optimization |
| SNR | Signal-to-Noise Ratio |
| SOCS | Sum of Coherent System |
| SR1 | Symmetric Rank One |
| SVD | Singular Value Decomposition |
| WG | Waveguide Method |
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