Chapter 8. High-Speed Waveform Analysis Using All-Optical Sampling

Peter A. Andrekson and Mathias Westlund


When there is a need to accurately characterize optical waveforms and eye diagrams, it is perhaps not surprising that some of the best, albeit only recently established, techniques to do this rely on all-optical phenomena. Some basic reasons why all-optical sampling holds great promise as a very useful tool well into the foreseeable future are that there are no ringing phenomena with associated waveform distortion as in electronic sampling due to impedance mismatch and that the time resolution can be made extremely high (<< 1 ps) while yet ...

Get Digital Communications Test and Measurement: High-Speed Physical Layer Characterization now with the O’Reilly learning platform.

O’Reilly members experience live online training, plus books, videos, and digital content from nearly 200 publishers.