R3.5 Test Compression
[Barnhart 2002] C. Barnhart, V. Brunkhorst, F. Distler, O. Farnsworth, A. Ferko, B. Keller, D. Scott, B. Koenemann, T. Onodera, Extending OPMISR beyond 10x scan test efficiency IEEE Design & Test of Computers 19 5 May-June 2002, 65-73
[Bayraktaroglu 2001] I. Bayraktaroglu, A. Orailoglu, Test volume and application time reduction through scan chain concealment Proc. ACM/IEEE Design Automation Conf. June 2001, 151-155
[Bayraktaroglu 2003] I. Bayraktaroglu, A. Orailoglu, Concurrent application of compaction and compression for test time and data volume reduction in scan designs IEEE Trans. on Computers 52 11 November 2003, 1480-1489
[Beck 2005] M. Beck, O. Barondeau, M. Kaibel, F. Poehl, X. Lin, R. Press ...
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