14.5. Advanced Test Generation

Thus far, the discussions have focused primarily on the basic ATPG algorithms. As circuits have become increasingly larger and more complex, more powerful ATPG algorithms are needed. In particular, the handling of sequential circuits is a must, because not all circuits may have the luxury of having a full-scan inserted. Next, deterministic ATPGs may face tremendous hurdles when dealing with the need to generate a sequence of many vectors. In this regard, simulation-based ATPGs may be better suited. Finally, the stuck-at fault model may be insufficient in capturing defects that occur at the deep-submicron or nano-scale designs. Such defects include delay faults and bridging faults. This section addresses how the ...

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