6.4. Characterization of magnetic-oxide thin films
Characterization of magnetic-oxide thin films includes a range of techniques. The most conventional of these build off of typical measurements applied to bulk materialsâincluding magnetometry (in the form of vibrating sample (VSM) and superconducting quantum interference device (SQUID) magnetometers) and magnetotransport. For magnetometry, the only special consideration that needs to be taken is the relative volume of the magnetic film material as compared to that of the substrate. Because the vastly different volume between a film (â¼10â7â10â6Â cm3) and substrate (â¼10â2Â cm3), even a strongly magnetic thin film can be swamped out by the diamagnetic background of the much larger substrate. ...
Get Epitaxial Growth of Complex Metal Oxides now with the O’Reilly learning platform.
O’Reilly members experience live online training, plus books, videos, and digital content from nearly 200 publishers.